- Definitions, classifications, and test conditions
- A review of failure patterns during burn-in
- Vividly illustrated with figures, tables and charts
- A quick calculation approach for time determination
- A roadmap for practical applications
Burn-in testing (an alternative to ESS) is widely used as an aid in producing failure-free electronic components. When scientifically planned and conducted, burn-in-testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level.
This book covers all aspects of burn-in-testing, from basic definitions to state-of-the-art concepts. Drawing on a broad database of studies, Burn-In Testing emphasizes mathematical and statistical models for quantifying the failure process, optimizing component reliability, and minimizing the total cost. With each chapter, the book also offers the appropriate FORTRAN code for the processes described. Burn-Testing is ideal for practicing engineers in the fields of reliability, life testing, and product assurance. It is also useful for upper division and graduate students in these and related fields.